November 20th, 10:00 CET (Berlin) / 04:00 EST (Detroit) / 14:30 IST (Bangalore) / 17:00 CST (Beijing)
November 20th, 15:00 CET (Berlin) / 09:00 EST (Detroit) / 19:30 IST (Bangalore) / 22:00 CST (Beijing)
Join our upcoming free webinar to learn how to maximize the value of test data across all phases of the V-Cycle, from early development to in-vehicle testing. Embedded software projects generate an extensive volume of test data, but how can this data be effectively leveraged to ensure that all critical scenarios are identified? Traditional requirements-based testing often focuses on individual requirements per test case, making comprehensive manual analysis impractical.
In this session, Wolfgang Meincke and Leif Driebold will introduce “Formal Test”, a state-of-the-art, highly automated approach that helps you extract maximum insights from existing test data with minimal effort. Additionally, discover a new AI-driven solution that revolutionizes the preparation of the “Formal Test” environment by automating the translation from natural language requirements to machine-readable patterns, making the process more efficient and robust than ever before.
Don’t miss this opportunity to enhance your testing strategies and leverage cutting-edge technology for superior results.